Resonance frequency shift of strongly heated micro-cantilevers

Frequency dependence of viscous and viscoelastic dissipation in coated micro-cantilevers from noise measurement.

We measure the mechanical thermal noise of soft silicon atomic force microscope cantilevers. Using an interferometric setup, we obtain a resolution down to 10(-14) m Hz(-1/2) on a wide spectral range (3-10(5) Hz). The low frequency behavior depends dramatically on the presence of a reflective coating: almost flat spectra for uncoated cantilevers versus a 1/f like trend for coated ones. The addi...

Design and fabrication of micro-cantilevers for multi-frequency atomic force microscopy

Preamplifying Cantilevers for Contact Resonance Mode Imaging

A novel preamplifying cantilever (PCL) design for scanning probe microscopes (SPM) that is capable of mechanically amplifying specimen movements is presented. The sample motions in both out-of-plane and in-plane directions are amplified by the PCL. The spatial resolution of the cantilever is in the nanometer scale and is comparable with existing SPM cantilevers. Some of the proposed application...

Critical heat flux around strongly heated nanoparticles.

We study heat transfer from a heated nanoparticle into surrounding fluid using molecular dynamics simulations. We show that the fluid next to the nanoparticle can be heated well above its boiling point without a phase change. Under increasing nanoparticle temperature, the heat flux saturates, which is in sharp contrast with the case of flat interfaces, where a critical heat flux is observed fol...

Radio-Frequency Cantilevers for Scanning Probe Microscopy

We are fabricating radio-frequency silicon nitride cantilevers for the use in scanning probe microscopy. These cantilevers will be used to study dielectric fluctuations above thin polymers films and charging behavior in organic field-effect transistors. Further, we have fabricated doublyclamped cantilevers of similar dimension and constituency and employed a magnetomotive scheme to measure thei...